7ELX
The crystal structure of CTLA-4 and Fab
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL17U |
| Synchrotron site | SSRF |
| Beamline | BL17U |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2020-09-16 |
| Detector | DECTRIS EIGER2 X 16M |
| Wavelength(s) | 0.9791 |
| Spacegroup name | C 2 2 21 |
| Unit cell lengths | 95.923, 196.921, 148.389 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 44.200 - 2.140 |
| R-factor | 0.1778 |
| Rwork | 0.177 |
| R-free | 0.21720 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 6rp8 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.18.2_3874) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 45.640 | 2.180 |
| High resolution limit [Å] | 2.140 | 2.140 |
| Rmerge | 0.101 | 0.101 |
| Number of reflections | 76857 | |
| <I/σ(I)> | 27.12 | |
| Completeness [%] | 100.0 | |
| Redundancy | 7.8 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 285 | PEG8000 10%, 0.1M Na Citrate 0.1M (NH4)2SO4 |






