6ZLX
The structure of the ClpX-associated factor PDIP38
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2010-01-20 |
Detector | DECTRIS PILATUS3 6M |
Wavelength(s) | 1.07 |
Spacegroup name | P 62 |
Unit cell lengths | 120.095, 120.095, 48.586 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 39.310 - 3.394 |
R-factor | 0.2493 |
Rwork | 0.247 |
R-free | 0.28690 |
Structure solution method | MAD |
RMSD bond length | 0.002 |
RMSD bond angle | 0.533 |
Data reduction software | XDS |
Data scaling software | XDS |
Phasing software | SHARP |
Refinement software | PHENIX ((1.14_3260: ???)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 39.310 | 3.600 |
High resolution limit [Å] | 3.390 | 3.390 |
Number of reflections | 10813 | 1742 |
<I/σ(I)> | 15.6 | |
Completeness [%] | 99.0 | |
Redundancy | 11 | |
CC(1/2) | 0.999 | 0.730 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | BATCH MODE | 298 | 20% PEG 8000 |