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6XWX

Crystal structure of the Tof1-Csm3 complex

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsPETRA III, EMBL c/o DESY BEAMLINE P14 (MX2)
Synchrotron sitePETRA III, EMBL c/o DESY
BeamlineP14 (MX2)
Temperature [K]100
Detector technologyPIXEL
Collection date2019-05-27
DetectorDECTRIS EIGER X 16M
Wavelength(s)0.980
Spacegroup nameC 1 2 1
Unit cell lengths264.472, 82.034, 161.165
Unit cell angles90.00, 124.85, 90.00
Refinement procedure
Resolution45.730 - 3.100
R-factor0.238
Rwork0.237
R-free0.26400
Structure solution methodMOLECULAR REPLACEMENT
Starting model (for MR)5mqi
Data reduction softwareXDS
Data scaling softwareSTARANISO
Phasing softwarePHASER
Refinement softwareBUSTER (2.10.3)
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]76.7403.524
High resolution limit [Å]3.0903.090
Rpim0.0780.737
Number of reflections271641359
<I/σ(I)>7.11.2
Completeness [%]89.8
Redundancy7
CC(1/2)0.9960.365
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, SITTING DROP2930.2 M Potassium Acetate, 0.1 M Tris-HCl pH 7.5-8.5, 4-8% PEG 20000

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