6UTE
Crystal structure of Z032 Fab in complex with WNV EDIII
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 23-ID-D |
Synchrotron site | APS |
Beamline | 23-ID-D |
Temperature [K] | 80 |
Detector technology | PIXEL |
Collection date | 2018-10-28 |
Detector | DECTRIS PILATUS3 6M |
Wavelength(s) | 0.97934 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 96.230, 114.020, 127.260 |
Unit cell angles | 90.00, 109.50, 90.00 |
Refinement procedure
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 39.990 | 3.004 |
High resolution limit [Å] | 2.900 | 2.900 |
Rpim | 0.095 | 0.504 |
Number of reflections | 57405 | 5695 |
<I/σ(I)> | 5.6 | |
Completeness [%] | 99.7 | 99.5 |
Redundancy | 3.1 | 3.1 |
CC(1/2) | 0.980 | 0.640 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 293 | 0.2 M sodium bromide, 20% w/v polyethylene glycol 3,350 |