6TRS
Crystal structure of TFIIH subunit p52 in complex with p8
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ESRF BEAMLINE ID30B |
| Synchrotron site | ESRF |
| Beamline | ID30B |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2016-02-27 |
| Detector | DECTRIS EIGER X 4M |
| Wavelength(s) | 0.9677 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 74.216, 85.954, 92.172 |
| Unit cell angles | 90.00, 94.93, 90.00 |
Refinement procedure
| Resolution | 19.920 - 2.680 |
| R-factor | 0.217 |
| Rwork | 0.216 |
| R-free | 0.24000 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.008 |
| RMSD bond angle | 0.950 |
| Data reduction software | Aimless |
| Data scaling software | XDS |
| Phasing software | PHASER |
| Refinement software | BUSTER (2.10.3) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 19.920 | 2.950 |
| High resolution limit [Å] | 2.680 | 2.680 |
| Rmerge | 0.280 | 1.429 |
| Rpim | 0.140 | 0.715 |
| Number of reflections | 17307 | 865 |
| <I/σ(I)> | 5.7 | 1.2 |
| Completeness [%] | 88.7 | 49.5 |
| Redundancy | 4.9 | 4.8 |
| CC(1/2) | 0.983 | 0.318 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 8.5 | 293.15 | ammonium chloride, PEG 4000, TRIS |






