6TRS
Crystal structure of TFIIH subunit p52 in complex with p8
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | ESRF BEAMLINE ID30B |
Synchrotron site | ESRF |
Beamline | ID30B |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2016-02-27 |
Detector | DECTRIS EIGER X 4M |
Wavelength(s) | 0.9677 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 74.216, 85.954, 92.172 |
Unit cell angles | 90.00, 94.93, 90.00 |
Refinement procedure
Resolution | 19.920 - 2.680 |
R-factor | 0.217 |
Rwork | 0.216 |
R-free | 0.24000 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.008 |
RMSD bond angle | 0.950 |
Data reduction software | Aimless |
Data scaling software | XDS |
Phasing software | PHASER |
Refinement software | BUSTER (2.10.3) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 19.920 | 2.950 |
High resolution limit [Å] | 2.680 | 2.680 |
Rmerge | 0.280 | 1.429 |
Rpim | 0.140 | 0.715 |
Number of reflections | 17307 | 865 |
<I/σ(I)> | 5.7 | 1.2 |
Completeness [%] | 88.7 | 49.5 |
Redundancy | 4.9 | 4.8 |
CC(1/2) | 0.983 | 0.318 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 8.5 | 293.15 | ammonium chloride, PEG 4000, TRIS |