6RRV
Crystal structure of the Sir4 H-BRCT domain
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X10SA |
Synchrotron site | SLS |
Beamline | X10SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2012-05-21 |
Detector | DECTRIS PILATUS3 S 6M |
Wavelength(s) | 0.999 |
Spacegroup name | C 1 2 1 |
Unit cell lengths | 69.660, 38.130, 48.620 |
Unit cell angles | 90.00, 118.09, 90.00 |
Refinement procedure
Resolution | 42.892 - 1.100 |
R-factor | 0.1184 |
Rwork | 0.117 |
R-free | 0.14170 |
Structure solution method | SAD |
RMSD bond length | 0.010 |
RMSD bond angle | 1.249 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | SHELXCD |
Refinement software | PHENIX ((1.14_3260: ???)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 42.900 | 1.130 |
High resolution limit [Å] | 1.100 | 1.100 |
Number of reflections | 43703 | 2598 |
<I/σ(I)> | 20.8 | 7 |
Completeness [%] | 95.2 | |
Redundancy | 3.4 | |
CC(1/2) | 0.990 | 0.980 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 293 | 35% PEG 2000 MME 150 mM potassium bromide |