6RNX
Crystal structure of the essential repressor DdrO from radiation-resistant Deinococcus bacteria (Deinococcus deserti)
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ESRF BEAMLINE ID23-2 |
| Synchrotron site | ESRF |
| Beamline | ID23-2 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2015-04-16 |
| Detector | DECTRIS PILATUS3 X 2M |
| Wavelength(s) | 0.8726 |
| Spacegroup name | C 2 2 21 |
| Unit cell lengths | 32.902, 130.188, 154.766 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 49.810 - 2.840 |
| R-factor | 0.2258 |
| Rwork | 0.222 |
| R-free | 0.29580 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 6rmq |
| RMSD bond length | 0.011 |
| RMSD bond angle | 1.194 |
| Data reduction software | XDS |
| Data scaling software | SCALA |
| Phasing software | MOLREP |
| Refinement software | PHENIX (1.16_3549) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 50.000 | 2.940 |
| High resolution limit [Å] | 2.840 | 2.840 |
| Rmerge | 0.159 | |
| Number of reflections | 8234 | 764 |
| <I/σ(I)> | 8.6 | |
| Completeness [%] | 99.0 | |
| Redundancy | 9.6 | |
| CC(1/2) | 0.770 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | Bis-Tris pH 5.5, 0.2 M Na-thiocyanate, 2.3 M NaCl |






