EM specimen
| Vitrification | Yes |
EM Data Collection
| Microscope | JEOL 3200FSC |
| Electron Gun | FIELD EMISSION GUN |
| Accelerating Voltage (kV) | 300 |
| Detector | GATAN K2 SUMMIT (4k x 4k) |
3D Reconstruction
| Method | SINGLE PARTICLE |
| Resolution (Å) | 6.2 |
| Software | RELION,Gctf,UCSF Chimera,PHENIX |
| Symmetry | C1 |
| CTF correction | PHASE FLIPPING AND AMPLITUDE CORRECTION |
