6NCH
Crystal structure of CDP-Chase: Raster data collection
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | NSLS-II BEAMLINE 17-ID-2 |
| Synchrotron site | NSLS-II |
| Beamline | 17-ID-2 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2018-03-30 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.9793 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 61.711, 67.201, 111.286 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 19.760 - 2.000 |
| R-factor | 0.2029 |
| Rwork | 0.200 |
| R-free | 0.26130 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 3q1p |
| RMSD bond length | 0.008 |
| RMSD bond angle | 1.451 |
| Data reduction software | XDS |
| Data scaling software | Aimless (0.5.21) |
| Phasing software | MOLREP |
| Refinement software | REFMAC (5.8.0238) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 19.760 | 2.050 |
| High resolution limit [Å] | 2.000 | 2.000 |
| Rmerge | 0.357 | 1.105 |
| Rmeas | 0.385 | 1.192 |
| Rpim | 0.137 | 0.425 |
| Number of reflections | 30674 | 2248 |
| <I/σ(I)> | 4.3 | |
| Completeness [%] | 96.6 | 96.8 |
| Redundancy | 7 | 7 |
| CC(1/2) | 0.941 | 0.608 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 8.5 | 298 | 0.1 M Tris-HCl pH 8.5, 0.2 to 0.3 M Lithium sulfate, 26 to 29% PEG-4000 |






