6NA6
Serial Femtosecond X-ray Crystallography Structure of ECR in complex with NADPH
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | FREE ELECTRON LASER |
Source details | SACLA BEAMLINE BL3 |
Synchrotron site | SACLA |
Beamline | BL3 |
Temperature [K] | 293 |
Detector technology | CCD |
Collection date | 2017-05-23 |
Detector | MPCCD |
Wavelength(s) | 1 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 109.760, 78.050, 138.000 |
Unit cell angles | 90.00, 107.76, 90.00 |
Refinement procedure
Resolution | 31.817 - 2.100 |
R-factor | 0.275 |
Rwork | 0.274 |
R-free | 0.33340 |
RMSD bond length | 0.010 |
RMSD bond angle | 1.200 |
Data reduction software | CrystFEL |
Data scaling software | CrystFEL |
Phasing software | PHASER |
Refinement software | PHENIX |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 131.000 | 2.200 |
High resolution limit [Å] | 2.100 | 2.100 |
Number of reflections | 131589 | |
<I/σ(I)> | 6.65 | |
Completeness [%] | 100.0 | |
Redundancy | 43.93 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | BATCH MODE | 277 | MIDAS screen |