6LFV
Crystal structure of PCB4scFv(hN56D)
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | PHOTON FACTORY BEAMLINE BL-5A |
Synchrotron site | Photon Factory |
Beamline | BL-5A |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2016-02-26 |
Detector | ADSC QUANTUM 315 |
Wavelength(s) | 1 |
Spacegroup name | I 4 |
Unit cell lengths | 92.420, 92.420, 53.830 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 32.780 - 1.900 |
R-factor | 0.1907 |
Rwork | 0.189 |
R-free | 0.23080 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 3esu |
RMSD bond length | 0.002 |
RMSD bond angle | 0.521 |
Data reduction software | XDS |
Data scaling software | XDS |
Phasing software | MOLREP |
Refinement software | PHENIX (1.13_2998) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 32.780 | 1.950 |
High resolution limit [Å] | 1.900 | 1.900 |
Rmerge | 0.048 | 0.527 |
Number of reflections | 41553 | 1322 |
<I/σ(I)> | 25.8 | |
Completeness [%] | 99.9 | |
Redundancy | 7.4 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 293 | HEPES, PEG 8000, ethylene glycol |