6K4R
Crystal structure of SidJ-CaM-AMP ternary complex at 3.11 A
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL17U1 |
Synchrotron site | SSRF |
Beamline | BL17U1 |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2019-03-22 |
Detector | ADSC QUANTUM 315r |
Wavelength(s) | 0.97918 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 60.846, 159.178, 135.032 |
Unit cell angles | 90.00, 101.78, 90.00 |
Refinement procedure
Resolution | 66.094 - 3.109 |
R-factor | 0.2411 |
Rwork | 0.239 |
R-free | 0.27890 |
Structure solution method | SAD |
RMSD bond length | 0.002 |
RMSD bond angle | 0.565 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | MOLREP |
Refinement software | PHENIX ((1.11.1_2575: ???)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 132.187 | 3.280 |
High resolution limit [Å] | 3.109 | 3.110 |
Number of reflections | 41924 | 2246 |
<I/σ(I)> | 2 | |
Completeness [%] | 99.8 | |
Redundancy | 6.5 | |
CC(1/2) | 0.997 | 0.810 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 7.5 | 299 | 25% PEG 3350, 0.2M NaI, 0.1M HEPES 7.5 |