6K4L
Crystal structure of Se-labelled SidJ complex with CaM at 2.95 A
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL17U1 |
Synchrotron site | SSRF |
Beamline | BL17U1 |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2018-05-01 |
Detector | ADSC QUANTUM 315r |
Wavelength(s) | 0.97981 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 61.060, 159.246, 135.809 |
Unit cell angles | 90.00, 101.68, 90.00 |
Refinement procedure
Resolution | 68.316 - 2.949 |
R-factor | 0.2439 |
Rwork | 0.243 |
R-free | 0.26860 |
Structure solution method | SAD |
RMSD bond length | 0.004 |
RMSD bond angle | 0.872 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | PHASER |
Refinement software | PHENIX ((1.11.1_2575: ???)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 133.000 | 3.110 |
High resolution limit [Å] | 2.949 | 2.950 |
Number of reflections | 53504 | 54886 |
<I/σ(I)> | 2 | |
Completeness [%] | 99.9 | |
Redundancy | 6.8 | |
CC(1/2) | 0.997 | 0.607 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 7.5 | 299 | 25% PEG 3350, 0.2M NaI |