6G3P
X-ray structure of seleno-methionine labelled NSD3-PWWP1
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2014-06-02 |
Detector | DECTRIS PILATUS 2M-F |
Wavelength(s) | 0.9794 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 45.040, 88.550, 77.970 |
Unit cell angles | 90.00, 90.08, 90.00 |
Refinement procedure
Resolution | 17.280 - 2.800 |
R-factor | 0.221 |
Rwork | 0.219 |
R-free | 0.26200 |
Structure solution method | SAD |
RMSD bond length | 0.007 |
RMSD bond angle | 0.930 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | SOLVE |
Refinement software | BUSTER (2.11.7) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 17.280 | 3.000 |
High resolution limit [Å] | 2.800 | 2.800 |
Rmerge | 0.155 | 0.467 |
Rmeas | 0.183 | 0.548 |
Number of reflections | 29364 | 5430 |
<I/σ(I)> | 7.79 | 2.8 |
Completeness [%] | 99.2 | 97.9 |
Redundancy | 3.509 | 3.526 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 293 | 50 mM TRIS pH 9.0, 23% PEG3350 |