6G29
X-ray structure of NSD3-PWWP1 in complex with compound 6
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06DA |
| Synchrotron site | SLS |
| Beamline | X06DA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2015-10-17 |
| Detector | DECTRIS PILATUS 2M-F |
| Wavelength(s) | 1.000 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 44.003, 47.431, 64.287 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 38.170 - 1.700 |
| R-factor | 0.196 |
| Rwork | 0.195 |
| R-free | 0.21000 |
| RMSD bond length | 0.008 |
| RMSD bond angle | 0.890 |
| Data reduction software | XDS |
| Data scaling software | Aimless (0.5.12) |
| Phasing software | BALBES |
| Refinement software | BUSTER (2.11.7) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 38.170 | 1.703 |
| High resolution limit [Å] | 1.697 | 1.697 |
| Rmerge | 0.040 | 0.850 |
| Rmeas | 0.044 | 0.812 |
| Rpim | 0.017 | 0.314 |
| Number of reflections | 15020 | 2193 |
| <I/σ(I)> | 24.5 | 2.1 |
| Completeness [%] | 97.4 | 100 |
| Redundancy | 6.4 | 6.4 |
| CC(1/2) | 1.000 | 0.814 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 277 | 100mM Morpheus Buffer 3, 30% P550MME_P20K, 10% Morpheus Ethylene glycols |
