6G25
X-ray structure of NSD3-PWWP1 in complex with compound 4
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2018-03-07 |
Detector | DECTRIS PILATUS 6M-F |
Wavelength(s) | 1.000 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 44.203, 47.827, 63.856 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 38.280 - 1.432 |
R-factor | 0.207 |
Rwork | 0.206 |
R-free | 0.22900 |
RMSD bond length | 0.008 |
RMSD bond angle | 0.920 |
Data reduction software | XDS |
Data scaling software | Aimless (0.3.11) |
Phasing software | BALBES |
Refinement software | BUSTER (2.11.7) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 38.280 | 1.437 |
High resolution limit [Å] | 1.432 | 1.432 |
Rmerge | 0.049 | 0.800 |
Rmeas | 0.054 | 0.587 |
Rpim | 0.021 | 0.229 |
Number of reflections | 25595 | 7148 |
<I/σ(I)> | 17.7 | 2.2 |
Completeness [%] | 100.0 | 100 |
Redundancy | 6.4 | 6 |
CC(1/2) | 0.998 | 0.889 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 277 | 100mM Morpheus Buffer 3, 30% P550MME_P20K, 10% Morpheus Ethylene glycols |