6FYV
X-RAY STRUCTURE OF CLK4-KD(146-480)/CX-4945 AT 2.46A
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X10SA |
Synchrotron site | SLS |
Beamline | X10SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2016-08-05 |
Detector | DECTRIS PILATUS 6M |
Wavelength(s) | 1.00000 |
Spacegroup name | P 43 21 2 |
Unit cell lengths | 66.335, 66.335, 190.684 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 19.360 - 2.460 |
R-factor | 0.2041 |
Rwork | 0.203 |
R-free | 0.22340 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 6fyl |
RMSD bond length | 0.007 |
RMSD bond angle | 0.950 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | PHASER |
Refinement software | REFMAC |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 19.360 | 2.520 |
High resolution limit [Å] | 2.460 | 2.460 |
Rmerge | 0.084 | 0.889 |
Rmeas | 0.087 | 0.924 |
Number of reflections | 16267 | |
<I/σ(I)> | 23.9 | 3.4 |
Completeness [%] | 99.6 | 100 |
Redundancy | 12.9 | 13.3 |
CC(1/2) | 1.000 | 0.895 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 6.5 | 298 | 30% Pentaerythritol ethoxylate (15/4 EO/OH),0.05M Ammonium Sulfate, 0.05M TRIS |