6FYV
X-RAY STRUCTURE OF CLK4-KD(146-480)/CX-4945 AT 2.46A
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X10SA |
| Synchrotron site | SLS |
| Beamline | X10SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2016-08-05 |
| Detector | DECTRIS PILATUS 6M |
| Wavelength(s) | 1.00000 |
| Spacegroup name | P 43 21 2 |
| Unit cell lengths | 66.335, 66.335, 190.684 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 19.360 - 2.460 |
| R-factor | 0.2041 |
| Rwork | 0.203 |
| R-free | 0.22340 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 6fyl |
| RMSD bond length | 0.007 |
| RMSD bond angle | 0.950 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | REFMAC |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 19.360 | 2.520 |
| High resolution limit [Å] | 2.460 | 2.460 |
| Rmerge | 0.084 | 0.889 |
| Rmeas | 0.087 | 0.924 |
| Number of reflections | 16267 | |
| <I/σ(I)> | 23.9 | 3.4 |
| Completeness [%] | 99.6 | 100 |
| Redundancy | 12.9 | 13.3 |
| CC(1/2) | 1.000 | 0.895 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 6.5 | 298 | 30% Pentaerythritol ethoxylate (15/4 EO/OH),0.05M Ammonium Sulfate, 0.05M TRIS |






