6ECX

StiE O-MT residues 942-1257

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	APS BEAMLINE 23-ID-B
Synchrotron site	APS
Beamline	23-ID-B
Temperature [K]	100
Detector technology	PIXEL
Collection date	2016-06-07
Detector	DECTRIS EIGER X 16M
Wavelength(s)	1.033
Spacegroup name	P 43 21 2
Unit cell lengths	88.565, 88.565, 86.077
Unit cell angles	90.00, 90.00, 90.00

Refinement procedure

Resolution	44.282 - 1.900
R-factor	0.185
Rwork	0.183
R-free	0.22220
Structure solution method	MOLECULAR REPLACEMENT
Data reduction software	XDS
Data scaling software	XSCALE
Phasing software	PHASER (2.6.0)
Refinement software	PHENIX

Data quality characteristics

	Overall	Inner shell	Outer shell
Low resolution limit [Å]	44.282	44.282	2.010
High resolution limit [Å]	1.900	5.660	1.900
Rmerge	0.068	0.027	1.937
Rmeas	0.071	0.028	2.015
Number of reflections	27564	1171	4340
<I/σ(I)>	21.18	78.8	1.28
Completeness [%]	99.9	99.7	99.6
Redundancy	13.003	11.798	13.219
CC(1/2)	1.000	1.000	0.590

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION, SITTING DROP		277	25% PEG 8000, 0.1 M HEPES pH 7.4