6ECV
StiD O-MT residues 976-1266
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 23-ID-D |
Synchrotron site | APS |
Beamline | 23-ID-D |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2015-10-12 |
Detector | DECTRIS PILATUS3 6M |
Wavelength(s) | 1.033 |
Spacegroup name | P 1 |
Unit cell lengths | 40.182, 56.175, 72.251 |
Unit cell angles | 86.31, 84.89, 75.81 |
Refinement procedure
Resolution | 42.494 - 1.798 |
R-factor | 0.1684 |
Rwork | 0.167 |
R-free | 0.19440 |
Structure solution method | MOLECULAR REPLACEMENT |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | PHASER |
Refinement software | PHENIX |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 42.494 | 42.494 | 1.910 |
High resolution limit [Å] | 1.798 | 5.360 | 1.800 |
Rmerge | 0.073 | 0.050 | 0.667 |
Rmeas | 0.087 | 0.058 | 0.792 |
Number of reflections | 54842 | 2102 | 8699 |
<I/σ(I)> | 9.92 | 24.56 | 1.82 |
Completeness [%] | 96.6 | 97.3 | 94.5 |
Redundancy | 3.531 | 3.423 | 3.467 |
CC(1/2) | 0.996 | 0.996 | 0.662 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 293 | 20% PEG 3350, 0.2 M NaF |