6DHH

RT XFEL structure of Photosystem II 400 microseconds after the second illumination at 2.2 Angstrom resolution

This is a large structure.

Refinement Statistics

Experimental method:X-RAY DIFFRACTION (2.2 Å)

Cell axes117.691222.529308.514
Cell angles90.0090.0090.00
SpacegroupP 21 21 21
Resolution limits30.85 - 2.20
the highest resolution shell value2.229 - 2.200
R-factor0.1939
R-work0.19330
the highest resolution shell value0.358
R-free0.26430
the highest resolution shell value0.386

Data Collection Statistics

Resolution limits30.85 - 2.20
the highest resolution shell value -
Number of reflections407641
Completeness100.0
Redundancy133.39
the highest resolution shell value555.29

Crystallization Conditions

crystal IDmethodpHpH rangetemperatureunit
1BATCH MODE6.5298
1BATCH MODE6.5298
1BATCH MODE6.5298

Crystallization Reagents

IDcrystal IDsolution IDreagent nameconcentrationdetails
Crystallization Reagents in Literatures*
IDcrystal IDsolutionreagent nameconcentration (unit)details
Annotated Information is extracted from Literature Info*