6CDB

Crystal Structure of V66L CzrA in the Zn(II)bound state

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	ALS BEAMLINE 4.2.2
Synchrotron site	ALS
Beamline	4.2.2
Temperature [K]	100
Detector technology	CMOS
Collection date	2012-05-05
Detector	RDI CMOS_8M
Wavelength(s)	1.00000
Spacegroup name	P 21 21 2
Unit cell lengths	54.546, 73.360, 50.158
Unit cell angles	90.00, 90.00, 90.00

Refinement procedure

Resolution	29.608 - 1.990
R-factor	0.197
Rwork	0.195
R-free	0.22750
RMSD bond length	0.007
RMSD bond angle	0.822
Data reduction software	XDS
Data scaling software	Aimless
Phasing software	PHASER
Refinement software	PHENIX (1.10.1_2155)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	41.410	2.140
High resolution limit [Å]	1.990	1.990
Rmeas	0.073	0.782
Rpim	0.030	0.313
Number of reflections	13796
<I/σ(I)>	19.3	2.4
Completeness [%]	96.1	100
Redundancy	5.9	6.2
CC(1/2)	0.999	0.806

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION, HANGING DROP		293	100 mM Ches (pH 9.5), 200 mM NaCl and 10% polyethylene glycol 8000