6XWX
Crystal structure of the Tof1-Csm3 complex
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | PETRA III, EMBL c/o DESY BEAMLINE P14 (MX2) |
| Synchrotron site | PETRA III, EMBL c/o DESY |
| Beamline | P14 (MX2) |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-05-27 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.980 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 264.472, 82.034, 161.165 |
| Unit cell angles | 90.00, 124.85, 90.00 |
Refinement procedure
| Resolution | 45.730 - 3.100 |
| R-factor | 0.238 |
| Rwork | 0.237 |
| R-free | 0.26400 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 5mqi |
| Data reduction software | XDS |
| Data scaling software | STARANISO |
| Phasing software | PHASER |
| Refinement software | BUSTER (2.10.3) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 76.740 | 3.524 |
| High resolution limit [Å] | 3.090 | 3.090 |
| Rpim | 0.078 | 0.737 |
| Number of reflections | 27164 | 1359 |
| <I/σ(I)> | 7.1 | 1.2 |
| Completeness [%] | 89.8 | |
| Redundancy | 7 | |
| CC(1/2) | 0.996 | 0.365 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | 0.2 M Potassium Acetate, 0.1 M Tris-HCl pH 7.5-8.5, 4-8% PEG 20000 |






