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6W1P

RT XFEL structure of the one-flash state of Photosystem II (1F, S2-rich) at 2.26 Angstrom resolution

This is a non-PDB format compatible entry.
Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeFREE ELECTRON LASER
Source detailsSLAC LCLS BEAMLINE MFX
Synchrotron siteSLAC LCLS
BeamlineMFX
Temperature [K]298
Detector technologyCCD
Collection date2018-11-28
DetectorRAYONIX MX340-HS
Wavelength(s)1.3022
Spacegroup nameP 21 21 21
Unit cell lengths116.958, 221.639, 307.888
Unit cell angles90.00, 90.00, 90.00
Refinement procedure
Resolution33.540 - 2.260
R-factor0.1736
Rwork0.173
R-free0.24080
Structure solution methodMOLECULAR REPLACEMENT
Starting model (for MR)6dhe
RMSD bond length0.016
RMSD bond angle1.581
Data reduction softwarecctbx.xfel
Phasing softwarePHASER
Refinement softwarePHENIX (1.17.1_3660)
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]33.5502.300
High resolution limit [Å]2.2602.260
Number of reflections37100717988
<I/σ(I)>11.8
Completeness [%]99.6
Redundancy41.6
CC(1/2)0.9620.091
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1BATCH MODE2980.1 M MES pH 6.5, 0.1 M NH4Cl, 35% (w/v) PEG 5000

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