6OKN
OX40R (TNFRSF4) bound to Fab 1A7
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 22-ID |
Synchrotron site | APS |
Beamline | 22-ID |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2016-06-22 |
Detector | RAYONIX MX300HE |
Wavelength(s) | 1.000 |
Spacegroup name | P 43 21 2 |
Unit cell lengths | 121.590, 121.590, 198.080 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 29.490 - 3.250 |
R-factor | 0.194 |
Rwork | 0.192 |
R-free | 0.22800 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.008 |
RMSD bond angle | 1.110 |
Data reduction software | MOSFLM |
Data scaling software | Aimless (0.5.28) |
Phasing software | PHASER |
Refinement software | BUSTER (2.11.6) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 29.490 | 29.490 | 3.470 |
High resolution limit [Å] | 3.250 | 9.190 | 3.250 |
Rmerge | 0.166 | 0.078 | 0.692 |
Rmeas | 0.172 | 0.082 | 0.733 |
Rpim | 0.047 | 0.023 | 0.234 |
Number of reflections | 24096 | 1174 | 4263 |
<I/σ(I)> | 9.2 | ||
Completeness [%] | 99.8 | 97.2 | 99.4 |
Redundancy | 13.3 | 12.5 | 9.1 |
CC(1/2) | 0.997 | 0.997 | 0.925 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 293 | tbd |