6NA6
Serial Femtosecond X-ray Crystallography Structure of ECR in complex with NADPH
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | FREE ELECTRON LASER |
| Source details | SACLA BEAMLINE BL3 |
| Synchrotron site | SACLA |
| Beamline | BL3 |
| Temperature [K] | 293 |
| Detector technology | CCD |
| Collection date | 2017-05-23 |
| Detector | MPCCD |
| Wavelength(s) | 1 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 109.760, 78.050, 138.000 |
| Unit cell angles | 90.00, 107.76, 90.00 |
Refinement procedure
| Resolution | 31.817 - 2.100 |
| R-factor | 0.275 |
| Rwork | 0.274 |
| R-free | 0.33340 |
| RMSD bond length | 0.010 |
| RMSD bond angle | 1.200 |
| Data reduction software | CrystFEL |
| Data scaling software | CrystFEL |
| Phasing software | PHASER |
| Refinement software | PHENIX |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 131.000 | 2.200 |
| High resolution limit [Å] | 2.100 | 2.100 |
| Number of reflections | 131589 | |
| <I/σ(I)> | 6.65 | |
| Completeness [%] | 100.0 | |
| Redundancy | 43.93 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | BATCH MODE | 277 | MIDAS screen |






