6K4L
Crystal structure of Se-labelled SidJ complex with CaM at 2.95 A
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL17U1 |
| Synchrotron site | SSRF |
| Beamline | BL17U1 |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2018-05-01 |
| Detector | ADSC QUANTUM 315r |
| Wavelength(s) | 0.97981 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 61.060, 159.246, 135.809 |
| Unit cell angles | 90.00, 101.68, 90.00 |
Refinement procedure
| Resolution | 68.316 - 2.949 |
| R-factor | 0.2439 |
| Rwork | 0.243 |
| R-free | 0.26860 |
| Structure solution method | SAD |
| RMSD bond length | 0.004 |
| RMSD bond angle | 0.872 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | PHASER |
| Refinement software | PHENIX ((1.11.1_2575: ???)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 133.000 | 3.110 |
| High resolution limit [Å] | 2.949 | 2.950 |
| Number of reflections | 53504 | 54886 |
| <I/σ(I)> | 2 | |
| Completeness [%] | 99.9 | |
| Redundancy | 6.8 | |
| CC(1/2) | 0.997 | 0.607 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7.5 | 299 | 25% PEG 3350, 0.2M NaI |






