6FYO
X-RAY STRUCTURE OF CLK1-KD(148-484)/Cpd-2 AT 2.32A
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X10SA |
| Synchrotron site | SLS |
| Beamline | X10SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2016-04-24 |
| Detector | DECTRIS PILATUS 6M |
| Wavelength(s) | 0.99998 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 62.039, 49.511, 65.514 |
| Unit cell angles | 90.00, 117.55, 90.00 |
Refinement procedure
| Resolution | 19.810 - 2.320 |
| R-factor | 0.2043 |
| Rwork | 0.203 |
| R-free | 0.23350 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 5j1w |
| RMSD bond length | 0.007 |
| RMSD bond angle | 0.948 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | REFMAC |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 19.810 | 2.380 |
| High resolution limit [Å] | 2.320 | 2.320 |
| Rmerge | 0.059 | 0.334 |
| Rmeas | 0.070 | 0.409 |
| Number of reflections | 15267 | |
| <I/σ(I)> | 16.7 | 3.3 |
| Completeness [%] | 98.1 | 93.9 |
| Redundancy | 3.3 | 2.8 |
| CC(1/2) | 0.998 | 0.885 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 5.5 | 298 | 25% PEG3350,0.2M Ammonium Sulfate, 0.1M TRIS |






