5YET
Structure of R354_WT
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL19U1 |
Synchrotron site | SSRF |
Beamline | BL19U1 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2016-06-12 |
Detector | DECTRIS PILATUS3 S 6M |
Wavelength(s) | 0.9785 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 97.846, 57.809, 99.948 |
Unit cell angles | 90.00, 108.39, 90.00 |
Refinement procedure
Resolution | 48.949 - 2.806 |
R-factor | 0.1967 |
Rwork | 0.195 |
R-free | 0.24160 |
Structure solution method | SAD |
RMSD bond length | 0.002 |
RMSD bond angle | 0.495 |
Data reduction software | PHENIX |
Data scaling software | HKL-2000 |
Phasing software | PHENIX |
Refinement software | PHENIX ((1.11.1_2575)) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 48.949 |
High resolution limit [Å] | 2.806 |
Number of reflections | 22531 |
<I/σ(I)> | 13.05 |
Completeness [%] | 85.5 |
Redundancy | 4.8 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 293 | 200mM ammonium tartrate, 20% PEG 3350 |