5Y0E
Crystal structure of TssK
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL19U1 |
Synchrotron site | SSRF |
Beamline | BL19U1 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2015-12-31 |
Detector | DECTRIS PILATUS 6M-F |
Wavelength(s) | 0.9785 |
Spacegroup name | P 65 2 2 |
Unit cell lengths | 151.832, 151.832, 313.195 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 19.970 - 2.500 |
R-factor | 0.221 |
Rwork | 0.219 |
R-free | 0.26200 |
Structure solution method | SAD |
RMSD bond length | 0.013 |
RMSD bond angle | 1.135 |
Data reduction software | XDS |
Data scaling software | SCALA |
Phasing software | PHENIX |
Refinement software | PHENIX ((DEV_2247: ???)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 20.000 | 2.640 |
High resolution limit [Å] | 2.500 | 2.500 |
Number of reflections | 74200 | |
<I/σ(I)> | 21 | |
Completeness [%] | 99.8 | 100 |
Redundancy | 40 | 41 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 6.75 | 283 | PEG4000, Li2SO4, 2-Proponal |