5XCX
Crystal structure of TS2/16 Fv-clasp fragment
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SPRING-8 BEAMLINE BL44XU |
Synchrotron site | SPring-8 |
Beamline | BL44XU |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2015-09-21 |
Detector | RAYONIX MX300HE |
Wavelength(s) | 0.9 |
Spacegroup name | P 41 21 2 |
Unit cell lengths | 69.200, 69.200, 171.540 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 47.050 - 2.040 |
R-factor | 0.19574 |
Rwork | 0.194 |
R-free | 0.22711 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.008 |
RMSD bond angle | 1.288 |
Data reduction software | XDS |
Data scaling software | XDS |
Phasing software | PHASER |
Refinement software | REFMAC (5.8.0155) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 47.050 | 2.170 |
High resolution limit [Å] | 2.040 | 2.040 |
Number of reflections | 27142 | |
<I/σ(I)> | 18.42 | 3.94 |
Completeness [%] | 99.6 | 97.4 |
Redundancy | 15.8 | 15.9 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 293 | 1.2M NaH2PO4/0.8M K2HPO4, 0.1M CAPS (pH10.5), 0.2M Li2SO4 |