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5XCX

Crystal structure of TS2/16 Fv-clasp fragment

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsSPRING-8 BEAMLINE BL44XU
Synchrotron siteSPring-8
BeamlineBL44XU
Temperature [K]100
Detector technologyCCD
Collection date2015-09-21
DetectorRAYONIX MX300HE
Wavelength(s)0.9
Spacegroup nameP 41 21 2
Unit cell lengths69.200, 69.200, 171.540
Unit cell angles90.00, 90.00, 90.00
Refinement procedure
Resolution47.050 - 2.040
R-factor0.19574
Rwork0.194
R-free0.22711
Structure solution methodMOLECULAR REPLACEMENT
RMSD bond length0.008
RMSD bond angle1.288
Data reduction softwareXDS
Data scaling softwareXDS
Phasing softwarePHASER
Refinement softwareREFMAC (5.8.0155)
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]47.0502.170
High resolution limit [Å]2.0402.040
Number of reflections27142
<I/σ(I)>18.423.94
Completeness [%]99.697.4
Redundancy15.815.9
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION2931.2M NaH2PO4/0.8M K2HPO4, 0.1M CAPS (pH10.5), 0.2M Li2SO4

227111

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