5XAM
Crystal structure of SecDF in I form at 4 A resolution
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SPRING-8 BEAMLINE BL32XU |
| Synchrotron site | SPring-8 |
| Beamline | BL32XU |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2016-10-30 |
| Detector | DECTRIS EIGER X 9M |
| Wavelength(s) | 1 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 93.320, 62.260, 181.710 |
| Unit cell angles | 90.00, 101.71, 90.00 |
Refinement procedure
| Resolution | 47.985 - 4.000 |
| R-factor | 0.3395 |
| Rwork | 0.333 |
| R-free | 0.40200 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 3aqp |
| RMSD bond length | 0.003 |
| RMSD bond angle | 0.708 |
| Data reduction software | HKL |
| Data scaling software | SCALEPACK |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.10.1_2155) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 50.000 | 50.000 | 4.070 |
| High resolution limit [Å] | 4.000 | 10.820 | 4.000 |
| Rmerge | 0.156 | 0.075 | 0.821 |
| Rmeas | 0.186 | 0.094 | |
| Rpim | 0.111 | 0.055 | 0.625 |
| Number of reflections | 17534 | ||
| <I/σ(I)> | 2.9 | ||
| Completeness [%] | 36.0 | 64.4 | 14.5 |
| Redundancy | 2.5 | 2.6 | 2.1 |
| CC(1/2) | 0.990 | 0.379 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | LIPIDIC CUBIC PHASE | 6 | 298 | 38% PEG 200, NH4-citrate |






