5WS6
Native XFEL structure of Photosystem II (preflash two-flash dataset
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | FREE ELECTRON LASER |
Source details | SACLA BEAMLINE BL3 |
Synchrotron site | SACLA |
Beamline | BL3 |
Temperature [K] | 293 |
Detector technology | CCD |
Collection date | 2016-10-10 |
Detector | MPCCD |
Wavelength(s) | 1.77 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 124.960, 230.220, 286.020 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 19.996 - 2.350 |
R-factor | 0.1313 |
Rwork | 0.129 |
R-free | 0.17510 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.009 |
RMSD bond angle | 1.370 |
Data reduction software | CrystFEL |
Data scaling software | CrystFEL |
Phasing software | PHASER |
Refinement software | PHENIX (1.9_1692) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.000 | 2.440 |
High resolution limit [Å] | 2.350 | 2.350 |
Number of reflections | 357084 | |
<I/σ(I)> | 9.2 | |
Completeness [%] | 100.0 | |
Redundancy | 742 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | BATCH MODE | 293 | PEG, magnesium sulfate |