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5WS6

Native XFEL structure of Photosystem II (preflash two-flash dataset

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeFREE ELECTRON LASER
Source detailsSACLA BEAMLINE BL3
Synchrotron siteSACLA
BeamlineBL3
Temperature [K]293
Detector technologyCCD
Collection date2016-10-10
DetectorMPCCD
Wavelength(s)1.77
Spacegroup nameP 21 21 21
Unit cell lengths124.960, 230.220, 286.020
Unit cell angles90.00, 90.00, 90.00
Refinement procedure
Resolution19.996 - 2.350
R-factor0.1313
Rwork0.129
R-free0.17510
Structure solution methodMOLECULAR REPLACEMENT
RMSD bond length0.009
RMSD bond angle1.370
Data reduction softwareCrystFEL
Data scaling softwareCrystFEL
Phasing softwarePHASER
Refinement softwarePHENIX (1.9_1692)
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]50.0002.440
High resolution limit [Å]2.3502.350
Number of reflections357084
<I/σ(I)>9.2
Completeness [%]100.0
Redundancy742
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1BATCH MODE293PEG, magnesium sulfate

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