5WS5
Native XFEL structure of photosystem II (preflash dark dataset)
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | FREE ELECTRON LASER |
Source details | SACLA BEAMLINE BL3 |
Synchrotron site | SACLA |
Beamline | BL3 |
Temperature [K] | 293 |
Detector technology | CCD |
Collection date | 2016-10-10 |
Detector | MPCCD |
Wavelength(s) | 1.77 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 124.700, 229.890, 285.500 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 19.996 - 2.350 |
R-factor | 0.1346 |
Rwork | 0.133 |
R-free | 0.17130 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 5gth |
RMSD bond length | 0.008 |
RMSD bond angle | 1.410 |
Data reduction software | CrystFEL |
Data scaling software | CrystFEL |
Phasing software | PHASER |
Refinement software | PHENIX (1.9_1692) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.000 | 2.400 |
High resolution limit [Å] | 2.350 | 2.350 |
Number of reflections | 357086 | |
<I/σ(I)> | 10.5 | |
Completeness [%] | 100.0 | |
Redundancy | 978 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | BATCH MODE | 293 | PEG, magnesium sulfate |