5WPP
Crystal structure HpiC1 W73M/K132M
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 23-ID-B |
Synchrotron site | APS |
Beamline | 23-ID-B |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2016-12-14 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 0.979 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 44.920, 81.140, 131.680 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 39.300 - 1.700 |
R-factor | 0.1826 |
Rwork | 0.181 |
R-free | 0.21480 |
Structure solution method | SAD |
RMSD bond length | 0.005 |
RMSD bond angle | 0.811 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | PHENIX |
Refinement software | PHENIX (1.11.1_2575) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 39.300 |
High resolution limit [Å] | 1.700 |
Number of reflections | 53625 |
<I/σ(I)> | 16.97 |
Completeness [%] | 99.0 |
Redundancy | 6.7 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 7.6 | 293 | 23% PEG 3350, 200 mM CaCl2, 5% trehalose |