5VVF
Crystal Structure of 354BG1 Fab
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRL BEAMLINE BL12-2 |
Synchrotron site | SSRL |
Beamline | BL12-2 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2015-07-10 |
Detector | DECTRIS PILATUS3 S 6M |
Wavelength(s) | 1.0 |
Spacegroup name | P 32 2 1 |
Unit cell lengths | 95.630, 95.630, 103.951 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 29.970 - 2.000 |
R-factor | 0.214 |
Rwork | 0.210 |
R-free | 0.24700 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 2909 FAB (PDB CODE 3PIQ) |
RMSD bond length | 0.007 |
RMSD bond angle | 0.948 |
Data reduction software | Aimless (7.0.038) |
Data scaling software | Aimless (7.0.038) |
Refinement software | PHENIX ((1.11_2567: ???)) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 82.820 |
High resolution limit [Å] | 2.000 |
Number of reflections | 37475 |
<I/σ(I)> | 7.9 |
Completeness [%] | 99.7 |
Redundancy | 5.5 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 8 | 293 | 1.8 M ammonium sulfate, 0.1 M Bis-Tris pH 6.5, 2% v/v PEG 550 MME, 100 nM NDSB-256 |