5U9W
Structure of CNTnw N149L in the intermediate 3 state
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 22-ID |
| Synchrotron site | APS |
| Beamline | 22-ID |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2016-10-08 |
| Detector | MARMOSAIC 300 mm CCD |
| Wavelength(s) | 0.97779 |
| Spacegroup name | P 61 |
| Unit cell lengths | 115.588, 115.588, 272.394 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 29.964 - 3.555 |
| R-factor | 0.2547 |
| Rwork | 0.253 |
| R-free | 0.27560 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 5l26 |
| RMSD bond length | 0.010 |
| RMSD bond angle | 0.974 |
| Data reduction software | HKL-2000 (v705a) |
| Data scaling software | Aimless |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.9_1692) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 30.000 | 3.610 |
| High resolution limit [Å] | 3.550 | 3.550 |
| Rpim | 0.050 | 0.690 |
| Number of reflections | 24655 | |
| <I/σ(I)> | 16.4 | 1.7 |
| Completeness [%] | 99.9 | 100 |
| Redundancy | 8.4 | 8.5 |
| CC(1/2) | 0.930 | 0.560 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7 | 290 | 10mM Mg(OAc)2, 25% PEG400 |






