5SXC
Crystal Structure of PI3Kalpha in complex with fragment 8
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | ALS BEAMLINE 5.0.2 |
Synchrotron site | ALS |
Beamline | 5.0.2 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2014-10-17 |
Detector | DECTRIS PILATUS3 S 6M |
Wavelength(s) | 1.0 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 114.735, 117.271, 150.299 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 92.460 - 3.550 |
R-factor | 0.1974 |
Rwork | 0.194 |
R-free | 0.26760 |
Structure solution method | FOURIER SYNTHESIS |
Starting model (for MR) | 4ovu |
RMSD bond length | 0.011 |
RMSD bond angle | 1.531 |
Data reduction software | HKL-2000 |
Data scaling software | SCALEPACK |
Phasing software | REFMAC |
Refinement software | REFMAC (5.8.0135) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 92.460 | 50.000 | 3.680 |
High resolution limit [Å] | 3.550 | 7.640 | 3.550 |
Rmerge | 0.113 | 0.038 | 0.848 |
Number of reflections | 25308 | ||
<I/σ(I)> | 7.2 | ||
Completeness [%] | 100.0 | 100 | 100 |
Redundancy | 7.3 | 6.6 | 7.5 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 7 | 298 | NaFormate |