5RKV
PanDDA analysis group deposition -- Crystal Structure of PHIP in complex with Z56877838
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | DIAMOND BEAMLINE I03 |
| Synchrotron site | Diamond |
| Beamline | I03 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-08-02 |
| Detector | DECTRIS PILATUS 6M |
| Wavelength(s) | 0.97622 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 81.137, 27.095, 56.370 |
| Unit cell angles | 90.00, 100.43, 90.00 |
Refinement procedure
| Resolution | 39.900 - 1.277 |
| R-factor | 0.1848 |
| Rwork | 0.184 |
| R-free | 0.19250 |
| Structure solution method | FOURIER SYNTHESIS |
| Starting model (for MR) | 3mb3 |
| RMSD bond length | 0.008 |
| RMSD bond angle | 0.870 |
| Data reduction software | XDS |
| Data scaling software | Aimless |
| Phasing software | REFMAC |
| Refinement software | BUSTER (2.10.3 (29-NOV-2019)) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 39.898 | 39.898 | 1.352 |
| High resolution limit [Å] | 1.288 | 3.758 | 1.288 |
| Rmeas | 0.043 | 0.043 | 0.203 |
| Rpim | 0.017 | 0.017 | 0.111 |
| Total number of observations | 150134 | 7970 | 4024 |
| Number of reflections | 25803 | ||
| <I/σ(I)> | 26.7 | 48.9 | 4.8 |
| Completeness [%] | 87.3 | 97.4 | 36.9 |
| Redundancy | 5.8 | 6.2 | 3.1 |
| CC(1/2) | 0.999 | 0.998 | 0.981 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 5.6 | 277 | 20% PEG 8000, 0.04M potassium phosphate |






