5OW5
p60p80-CAMSAP complex
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06DA |
| Synchrotron site | SLS |
| Beamline | X06DA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2015-08-19 |
| Detector | DECTRIS PILATUS 2M-F |
| Wavelength(s) | 1.000000 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 36.330, 79.060, 99.060 |
| Unit cell angles | 90.00, 94.97, 90.00 |
Refinement procedure
| Resolution | 41.860 - 1.700 |
| R-factor | 0.1914 |
| Rwork | 0.191 |
| R-free | 0.23220 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 5lb7 |
| RMSD bond length | 0.009 |
| RMSD bond angle | 0.897 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | PHENIX ((dev_2875: ???)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 41.900 | 1.800 |
| High resolution limit [Å] | 1.700 | 1.700 |
| Rmerge | 0.078 | 1.038 |
| Rpim | 0.022 | 0.445 |
| Number of reflections | 59910 | 8846 |
| <I/σ(I)> | 17.8 | |
| Completeness [%] | 97.5 | 91.6 |
| Redundancy | 11.5 | 7.4 |
| CC(1/2) | 0.999 | 0.656 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 5.5 | 293 | 20% PEG 3350, 0.1 M BisTris propane (pH 5.5), 0.2 M NaF |
