5MTZ
Crystal structure of a long form RNase Z from yeast
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SOLEIL BEAMLINE PROXIMA 1 |
| Synchrotron site | SOLEIL |
| Beamline | PROXIMA 1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2014-03-19 |
| Detector | DECTRIS PILATUS 6M |
| Wavelength(s) | 0.9792 |
| Spacegroup name | P 41 |
| Unit cell lengths | 136.000, 136.000, 115.810 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 49.610 - 2.990 |
| R-factor | 0.1849 |
| Rwork | 0.181 |
| R-free | 0.26170 |
| Structure solution method | SAD |
| RMSD bond length | 0.011 |
| RMSD bond angle | 1.503 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | SHELXCD |
| Refinement software | REFMAC (5.8.0158) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 49.610 | 49.607 | 3.170 |
| High resolution limit [Å] | 2.990 | 8.840 | 2.990 |
| Rmerge | 0.059 | 2.274 | |
| Rmeas | 0.063 | 2.437 | |
| Number of reflections | 83709 | 3230 | 13304 |
| <I/σ(I)> | 7.52 | 29.94 | 0.83 |
| Completeness [%] | 99.7 | 99.5 | 98.4 |
| Redundancy | 7.8 | 7.757 | 7.629 |
| CC(1/2) | 0.991 | 0.997 | 0.381 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | 0.1 M Hepes, pH 7.5, 25% (w/v) PEG 8000 |






