Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | FREE ELECTRON LASER |
| Source details | SLAC LCLS BEAMLINE XPP |
| Synchrotron site | SLAC LCLS |
| Beamline | XPP |
| Temperature [K] | 293 |
| Detector technology | PIXEL |
| Collection date | 2013-06-07 |
| Detector | CS-PAD XPP |
| Wavelength(s) | 1.36 |
| Spacegroup name | P 61 2 2 |
| Unit cell lengths | 92.707, 92.707, 129.524 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 80.290 - 2.520 |
| R-factor | 0.22218 |
| Rwork | 0.219 |
| R-free | 0.28803 |
| RMSD bond length | 0.012 |
| RMSD bond angle | 1.586 |
| Data reduction software | cctbx.xfel |
| Data scaling software | cctbx.xfel |
| Phasing software | MOLREP |
| Refinement software | REFMAC (5.8.0073) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 80.300 | 2.585 |
| High resolution limit [Å] | 2.500 | 2.500 |
| Number of reflections | 11101 | |
| <I/σ(I)> | 11.3 | 4.4 |
| Completeness [%] | 99.9 | 99.88 |
| Redundancy | 22 | 10.4 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | BATCH MODE | 293 | Batch crystallization 15% ammonium sulfate |
