5HFT
Crystal structure of HpxW
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 24-ID-C |
Synchrotron site | APS |
Beamline | 24-ID-C |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2012-02-18 |
Detector | DECTRIS PILATUS 6M-F |
Wavelength(s) | 0.979 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 70.671, 124.093, 156.781 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 48.651 - 2.646 |
R-factor | 0.2567 |
Rwork | 0.254 |
R-free | 0.29770 |
Structure solution method | SAD |
RMSD bond length | 0.008 |
RMSD bond angle | 1.049 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | SOLVE |
Refinement software | PHENIX |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 50.000 | 50.000 | 2.690 |
High resolution limit [Å] | 2.640 | 7.160 | 2.640 |
Rmerge | 0.113 | 0.039 | 0.522 |
Total number of observations | 138140 | ||
Number of reflections | 39286 | ||
<I/σ(I)> | 6.6 | ||
Completeness [%] | 96.0 | 96.5 | 83.6 |
Redundancy | 3.5 | 3.5 | 3 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | ||||
2 | VAPOR DIFFUSION, HANGING DROP | 288 | 12-20% PEG 3350, 0.2-0.7 M ammonium nitrate |