5HFT
Crystal structure of HpxW
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 24-ID-C |
| Synchrotron site | APS |
| Beamline | 24-ID-C |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2012-02-18 |
| Detector | DECTRIS PILATUS 6M-F |
| Wavelength(s) | 0.979 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 70.671, 124.093, 156.781 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 48.651 - 2.646 |
| R-factor | 0.2567 |
| Rwork | 0.254 |
| R-free | 0.29770 |
| Structure solution method | SAD |
| RMSD bond length | 0.008 |
| RMSD bond angle | 1.049 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | SOLVE |
| Refinement software | PHENIX |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 50.000 | 50.000 | 2.690 |
| High resolution limit [Å] | 2.640 | 7.160 | 2.640 |
| Rmerge | 0.113 | 0.039 | 0.522 |
| Total number of observations | 138140 | ||
| Number of reflections | 39286 | ||
| <I/σ(I)> | 6.6 | ||
| Completeness [%] | 96.0 | 96.5 | 83.6 |
| Redundancy | 3.5 | 3.5 | 3 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | ||||
| 2 | VAPOR DIFFUSION, HANGING DROP | 288 | 12-20% PEG 3350, 0.2-0.7 M ammonium nitrate |
