5GTI
Native XFEL structure of photosystem II (two flash dataset)
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | FREE ELECTRON LASER |
Source details | SACLA BEAMLINE BL3 |
Synchrotron site | SACLA |
Beamline | BL3 |
Temperature [K] | 293 |
Detector technology | CCD |
Collection date | 2016-03-16 |
Detector | MPCCD |
Wavelength(s) | 1.77 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 126.520, 231.230, 287.460 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 19.980 - 2.500 |
R-factor | 0.141 |
Rwork | 0.139 |
R-free | 0.18700 |
RMSD bond length | 0.008 |
RMSD bond angle | 1.373 |
Data reduction software | CrystFEL |
Data scaling software | CrystFEL |
Phasing software | PHASER |
Refinement software | PHENIX (1.8_1069) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 50.000 |
High resolution limit [Å] | 2.500 |
Number of reflections | 290634 |
<I/σ(I)> | 10.6 |
Completeness [%] | 100.0 |
Redundancy | 824 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | BATCH MODE | 293 | PEG, magnesium sulfate |