5GK2
The structure of the H302A mutant of StlD
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | PHOTON FACTORY BEAMLINE AR-NE3A |
| Synchrotron site | Photon Factory |
| Beamline | AR-NE3A |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2015-11-16 |
| Detector | DECTRIS PILATUS 2M-F |
| Wavelength(s) | 1.0000 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 63.170, 127.920, 108.150 |
| Unit cell angles | 90.00, 91.08, 90.00 |
Refinement procedure
| Resolution | 41.698 - 2.201 |
| R-factor | 0.1767 |
| Rwork | 0.174 |
| R-free | 0.22420 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 5gk0 |
| RMSD bond length | 0.008 |
| RMSD bond angle | 0.913 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | PHASER |
| Refinement software | PHENIX ((1.10_2155: ???)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 50.000 | 2.330 |
| High resolution limit [Å] | 2.200 | 2.200 |
| Rmerge | 0.079 | 0.504 |
| Number of reflections | 86674 | |
| <I/σ(I)> | 12.24 | 2.38 |
| Completeness [%] | 99.7 | 99.1 |
| Redundancy | 3.45 | 3.32 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | 12.5% PEG 4000, 100mM Tris-HCl (pH8.5) |
