5CSJ
S100B-RSK1 crystal structure B
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | ESRF BEAMLINE ID29 |
Synchrotron site | ESRF |
Beamline | ID29 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2015-06-21 |
Detector | DECTRIS PILATUS 2M |
Wavelength(s) | 0.9677 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 37.960, 68.930, 91.490 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 38.115 - 2.700 |
R-factor | 0.2067 |
Rwork | 0.203 |
R-free | 0.27640 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 3czt |
RMSD bond length | 0.022 |
RMSD bond angle | 1.376 |
Data reduction software | XDS |
Data scaling software | XDS |
Phasing software | PHASER |
Refinement software | PHENIX (dev_1750) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 38.120 | 2.770 |
High resolution limit [Å] | 2.700 | 2.700 |
Number of reflections | 7001 | |
<I/σ(I)> | 9.19 | 2.19 |
Completeness [%] | 99.9 | 100 |
Redundancy | 12.3 | 13.08 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 296 | 0.1 M Hepes 7, 150 mM NaCl, 20% PEG6000 |