5CSF
S100B-RSK1 crystal structure A
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06DA |
| Synchrotron site | SLS |
| Beamline | X06DA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2015-02-22 |
| Detector | DECTRIS PILATUS 2M |
| Wavelength(s) | 1.0 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 38.300, 39.240, 172.820 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 43.205 - 2.400 |
| R-factor | 0.2455 |
| Rwork | 0.243 |
| R-free | 0.29070 |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.245 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | PHASER |
| Refinement software | PHENIX (dev_1750) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 43.205 | 2.460 |
| High resolution limit [Å] | 2.400 | 2.400 |
| Number of reflections | 10773 | |
| <I/σ(I)> | 18.67 | 2.06 |
| Completeness [%] | 99.1 | 99.2 |
| Redundancy | 4.34 | 3.3 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 296 | 0.1 M Hepes 7, 150 mM NaCl, 20% PEG6000 |
