5CIO
Crystal structure of PqqF
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL19U1 |
Synchrotron site | SSRF |
Beamline | BL19U1 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2015-06-01 |
Detector | DECTRIS PILATUS 6M |
Wavelength(s) | 0.97845 |
Spacegroup name | C 1 2 1 |
Unit cell lengths | 175.090, 133.370, 92.110 |
Unit cell angles | 90.00, 119.40, 90.00 |
Refinement procedure
Resolution | 47.512 - 2.500 |
R-factor | 0.2015 |
Rwork | 0.199 |
R-free | 0.25450 |
RMSD bond length | 0.010 |
RMSD bond angle | 1.056 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | HKL-3000 |
Refinement software | PHENIX ((1.10.1_2155: ???)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 47.512 | 2.600 |
High resolution limit [Å] | 2.500 | 2.500 |
Rmerge | 0.135 | |
Number of reflections | 63299 | |
<I/σ(I)> | 11.95 | 1.92 |
Completeness [%] | 99.1 | 99.3 |
Redundancy | 6.9 | 7.08 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 7 | 289 | 35% Tacsimate |