5BOH
Crystal Structure of OXA-58 with the Substrate-Binding Cleft in a Closed State
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SPRING-8 BEAMLINE BL26B1 |
| Synchrotron site | SPring-8 |
| Beamline | BL26B1 |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2013-12-14 |
| Detector | RIGAKU SATURN A200 |
| Wavelength(s) | 1.0000 |
| Spacegroup name | H 3 |
| Unit cell lengths | 75.290, 75.290, 120.682 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 28.680 - 1.800 |
| R-factor | 0.1584 |
| Rwork | 0.149 |
| R-free | 0.16890 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 4oh0 |
| RMSD bond length | 0.007 |
| RMSD bond angle | 1.120 |
| Data reduction software | SCALA (3.3.20) |
| Data scaling software | SCALA (3.3.20) |
| Phasing software | PHASER (2.5.3) |
| Refinement software | PHENIX (1.9_1692) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 28.680 | 1.900 |
| High resolution limit [Å] | 1.800 | 1.800 |
| Rmerge | 0.093 | 0.346 |
| Number of reflections | 47274 | |
| <I/σ(I)> | 5.7 | 2.2 |
| Completeness [%] | 100.0 | 100 |
| Redundancy | 5.5 | 5.3 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7 | 297 | 0.1M MOPS pH 7.0, 1.5M Li2SO4 |
