5ZF2
Crystal structure of Trxlp from Edwardsiella tarda EIB202
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL19U1 |
| Synchrotron site | SSRF |
| Beamline | BL19U1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2016-11-21 |
| Detector | DECTRIS PILATUS3 6M |
| Wavelength(s) | 0.97852 |
| Spacegroup name | P 61 2 2 |
| Unit cell lengths | 34.273, 34.273, 264.702 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 22.059 - 1.980 |
| R-factor | 0.181 |
| Rwork | 0.177 |
| R-free | 0.21540 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 2yzu |
| RMSD bond length | 0.009 |
| RMSD bond angle | 0.923 |
| Data reduction software | HKL-3000 |
| Data scaling software | HKL-3000 |
| Phasing software | PHASER |
| Refinement software | PHENIX ((1.10.1_2155: ???)) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 50.000 | 50.000 | 2.000 |
| High resolution limit [Å] | 1.970 | 5.350 | 1.970 |
| Rmerge | 0.076 | 0.048 | 0.200 |
| Rmeas | 0.078 | 0.049 | 0.203 |
| Rpim | 0.014 | 0.010 | 0.037 |
| Number of reflections | 7481 | 499 | 351 |
| <I/σ(I)> | 8.1 | ||
| Completeness [%] | 99.9 | 99.8 | 99.7 |
| Redundancy | 30.4 | 25.3 | 29.3 |
| CC(1/2) | 0.999 | 0.993 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 6.5 | 293 | 30% PEG 8000, 100mM sodium acetate, pH6.5, 200mM lithium sulfate |






