5Z7A
Crystal structure of NDP52 SKICH region
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL17U1 |
Synchrotron site | SSRF |
Beamline | BL17U1 |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2014-06-10 |
Detector | AGILENT ATLAS CCD |
Wavelength(s) | 0.97946 |
Spacegroup name | P 31 |
Unit cell lengths | 46.502, 46.502, 99.561 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 37.333 - 2.380 |
R-factor | 0.2238 |
Rwork | 0.222 |
R-free | 0.26310 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 3vvv |
RMSD bond length | 0.003 |
RMSD bond angle | 0.589 |
Data reduction software | HKL-3000 |
Data scaling software | HKL-3000 |
Phasing software | PHASER |
Refinement software | PHENIX ((1.13_2998: ???)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.000 | 2.430 |
High resolution limit [Å] | 2.380 | 2.380 |
Number of reflections | 9783 | |
<I/σ(I)> | 12.49 | |
Completeness [%] | 90.3 | |
Redundancy | 3 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 6.7 | 289 | PEG 3350, 0.2 M potassium sulfate |